Your search returned 17 records. Click on the hyperlinks to view further details of Titles..
Magazine Name : Ieee Design And Test Of Computers
Year : 1998Volume number : 15Issue:03
Analyzing Packagint Trade-Offs During System Design.(Article) Subject:
Author:
Peter A
Sandborn
Mike
Vertal
page:
10
-
19
Effective Built-In Self-Test Forbooth Multipliers.(Article) Subject:
Author:
Dimitris.
Gizopoulos
Antonis
Paschalis
page:
105
-
111
Rapid Hardware Prototyping On Rpm-2.(Article) Subject:
Author:
Jaeheon
Jeong
Michel
Dubois
page:
112
-
118
Modeling And Optimizing The Costs Of Electronic Systems.(Article) Subject:
Author:
Michael
Scheffler
Daniel
Ammann
page:
20
-
27
Vlsi, Mcm, And Wsi: A Design Comparison.(Article) Subject:
Author:
Earl E.
Swartzalander
page:
28
-
34
The Role Of The Good-Die Project On Miniaturized-System Design.(Article) Subject:
Author:
Claudio
Truzzi
page:
35
-
43
Asic Challenges: Emerging From A Primordial Soup.(Article) Subject:
Author:
Wilfred
Corrigan
page:
4
-
7
Testing Nasa'S 3d-Stack Mcm Space Flight Computer.(Article) Subject:
Author:
Leon
Alkalai
Kappol
Sasidhar
page:
44
-
55
Guest Editor'S Introduction: Microprocessor Testing Today.(Article) Subject:
Author:
Wayne
Needham
page:
56
-
57
Design Of Chche Test Hardware On The Hp Pa8500.(Article) Subject:
Author:
Jeff
Brauch
Jay
Flesichman
page:
58
-
63
Testability Features Of The Amd-K6 Microprocessor.(Article) Subject:
Author:
Imtiaz P
Shaik
R. Scott
Fetherston
page:
64
-
59
Test Development For Second Generation Colfire Microprocessors.(Article) Subject:
Author:
Alfred L
Crouch
Dale
Amason
page:
70
-
76
Pentium Pro Processor Design For Test And Debug.(Article) Subject:
Author:
Adrian
Carbine
Derek
Feltham
page:
77
-
82
Guest Editors' Indtroduction: Early Modeling And Analysis Of Packaged Systems.(Article) Subject:
Author:
David E
Schimmel
Chryssa
Dislis
page:
8
-
9
Testing The 500-Mhz Ibm S/390 Micorprocssor .(Article) Subject:
Author:
Dale E
Hoffman
Thomas G
Foote
page:
83
-
89
Test Strategy For The Power Pc 750 Microprocessor.(Article) Subject:
Author:
Carol
Pyron
Javier
Prado
page:
90
-
97
Alpha 21164 Manufacturing Test Development And Coverate Analysis.(Article) Subject:
Author:
Richard
Cavies
Carol J
Stolicny
page:
98
-
104